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Molecular Origin of Charge Traps in Polyfluorene-Based SemiconductorsFARIA, Gregório C; DEAZEVEDO, Eduardo R; VON SEGGERN, Heinz et al.Macromolecules (Print). 2013, Vol 46, Num 19, pp 7865-7873, issn 0024-9297, 9 p.Article

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